Applied Materials’ new playbook for process control brings Big Data and AI technology to the core of chipmaking success. This innovation features new ExtractAI™ technology: the only solution in the industry that creates a real-time connection between the Big Data generated by the Enlight® optical inspection system and the SEMVision® eBeam review system to automatically and dynamically find and classify yield-killing defects faster, better and more cost effectively than legacy approaches.
Applied Materials’ new playbook for process control brings Big Data and AI technology to the core of chipmaking success. This innovation features new ExtractAI™ technology: the only solution in the industry that creates a real-time connection between the Big Data generated by the Enlight® optical inspection system and the SEMVision® eBeam review system to automatically and dynamically find and classify yield-killing defects faster, better and more cost effectively than legacy approaches.